搜索包含 Reliability Analysis Center (U.S.) 的图书 - 暨南大学图书馆

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	International marketing strategy : analysis, development and implementation 0 索取号：F740.2/E991.3 作者：Doole、 Isobel.、Lowe、 Robin、 1945-、出版社：Australia : Thomson Learning, c2001.		Motorola microprocessors 0 索取号：TN47-62/E907.2 作者：Motorola、 inc. Technical Information Center.、出版社：[Austin, Texas] : Motorola Inc., 1981.
	Hybrid microcircuit reliability data 0 索取号：TN406/E801 作者：IIT Research Institute.、Reliability Analysis Center (U.S.)、出版社：Oxford ; New York : Pergamon Press, 1975, c 1976.		Network analysis and practice 0 索取号：TN711/E902 作者：Walton、 A. K. (Alan Keith)、 1933-、出版社：Cambridge [Cambridgeshire] ; New York : Cambridge University Press, 1987
	Computer-aided analysis of power electronic systems 0 索取号：TN7/E907 作者：Rajagopalan、 Venkatachari、 1939-、出版社：New York : Dekker, c1987.		Motorola RF data manual 0 索取号：TN32-62/E991 作者：Motorola、 inc. Technical Information Center.、出版社：[Phoenix, Ariz.] : Motorola, 1990.
	Applied latent class analysis 0 索取号：O212/E20041 作者：出版社：Cambridge [England] ; New York, N.Y. : Cambridge University Press, 2002.		Experimental design and data analysis for biologists 0 索取号：Q-332/E20036 作者：Quinn、 G.P. (Gerald Peter)、 1956-、Keough、 Michael J.、出版社：Cambridge, UK : Cambridge University Press, 2002.
	Developments in electron microscopy and analysis, 1977 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held in Glasgow, 12-14 September 1977 (EMAG 77) 0 索取号：TN153-53/E803/1977 作者：出版社：Bristol : Institute of Physics, 1977.		Seventh National Conference on Electron Probe Analysis 0 索取号：TN146.8-53/E801/7 作者：National Conference on Electron Probe Analysis (7th : 1972 : San Francisco)、Electron Probe Analysis Society of America.、出版社：Pittsburgh : L. Vassamillet, Carnegie-Mellon University, [1972?]
	Sixth national conference on electron probe analysis : July 27-30, 1971 0 索取号：TN146.8-53/E801/6 作者：National Conference on Electron Probe Analysis (6th : 1971 : Pittsburgh、 Pennsylvania)、Electron Probe Analysis Society of America.、出版社：Pittsburgh, Pennsylvania : Pittsburgh Hilton Hotel, 1971.		VHDL : analysis and modeling of digital systems 0 索取号：TP303/E20031 作者：Navabi、 Zainalabedin.、出版社：New York : McGraw-Hill, c1993.
	Financial statement analysis : theory, application, and interpretation 0 索取号：F830.08/E809.5 作者：Bernstein、 Leopold A.、出版社：Homewood, IL : Irwin, c1993.		Analysis for financial management 0 索取号：F275/E20033.4-2 作者：Higgins、 Robert C.、出版社：Boston, Mass. ; Chicago : Irwin, c1995.
	1970 Annual Symposium on Reliability : proceedings : Los Angeles, California, February 3, 4, 5, 1970 0 索取号：TN06-53/E802/1970 作者：Symposium on Reliability (1970 : Los Angeles、 Calif.)、Institute of Electrical and Electronics Engineers.、出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers, c1970.		Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973 0 索取号：TN06-53/E801/11 作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.

	International marketing strategy : analysis, development and implementation 0 索取号：F740.2/E991.3 作者：Doole、 Isobel.、Lowe、 Robin、 1945-、出版社：Australia : Thomson Learning, c2001.		Motorola microprocessors 0 索取号：TN47-62/E907.2 作者：Motorola、 inc. Technical Information Center.、出版社：[Austin, Texas] : Motorola Inc., 1981.
	Hybrid microcircuit reliability data 0 索取号：TN406/E801 作者：IIT Research Institute.、Reliability Analysis Center (U.S.)、出版社：Oxford ; New York : Pergamon Press, 1975, c 1976.		Network analysis and practice 0 索取号：TN711/E902 作者：Walton、 A. K. (Alan Keith)、 1933-、出版社：Cambridge [Cambridgeshire] ; New York : Cambridge University Press, 1987
	Computer-aided analysis of power electronic systems 0 索取号：TN7/E907 作者：Rajagopalan、 Venkatachari、 1939-、出版社：New York : Dekker, c1987.		Motorola RF data manual 0 索取号：TN32-62/E991 作者：Motorola、 inc. Technical Information Center.、出版社：[Phoenix, Ariz.] : Motorola, 1990.
	Applied latent class analysis 0 索取号：O212/E20041 作者：出版社：Cambridge [England] ; New York, N.Y. : Cambridge University Press, 2002.		Experimental design and data analysis for biologists 0 索取号：Q-332/E20036 作者：Quinn、 G.P. (Gerald Peter)、 1956-、Keough、 Michael J.、出版社：Cambridge, UK : Cambridge University Press, 2002.
	Developments in electron microscopy and analysis, 1977 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held in Glasgow, 12-14 September 1977 (EMAG 77) 0 索取号：TN153-53/E803/1977 作者：出版社：Bristol : Institute of Physics, 1977.		Seventh National Conference on Electron Probe Analysis 0 索取号：TN146.8-53/E801/7 作者：National Conference on Electron Probe Analysis (7th : 1972 : San Francisco)、Electron Probe Analysis Society of America.、出版社：Pittsburgh : L. Vassamillet, Carnegie-Mellon University, [1972?]
	Sixth national conference on electron probe analysis : July 27-30, 1971 0 索取号：TN146.8-53/E801/6 作者：National Conference on Electron Probe Analysis (6th : 1971 : Pittsburgh、 Pennsylvania)、Electron Probe Analysis Society of America.、出版社：Pittsburgh, Pennsylvania : Pittsburgh Hilton Hotel, 1971.		VHDL : analysis and modeling of digital systems 0 索取号：TP303/E20031 作者：Navabi、 Zainalabedin.、出版社：New York : McGraw-Hill, c1993.
	Financial statement analysis : theory, application, and interpretation 0 索取号：F830.08/E809.5 作者：Bernstein、 Leopold A.、出版社：Homewood, IL : Irwin, c1993.		Analysis for financial management 0 索取号：F275/E20033.4-2 作者：Higgins、 Robert C.、出版社：Boston, Mass. ; Chicago : Irwin, c1995.
	1970 Annual Symposium on Reliability : proceedings : Los Angeles, California, February 3, 4, 5, 1970 0 索取号：TN06-53/E802/1970 作者：Symposium on Reliability (1970 : Los Angeles、 Calif.)、Institute of Electrical and Electronics Engineers.、出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers, c1970.		Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973 0 索取号：TN06-53/E801/11 作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.